Lock-in thermography : basics and use for evaluating electronic devices and materials
This book deals with lock-in thermography (LIT) as a special active dynamic variant of the well-known IR thermography. It enables a much improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. The book concentrates on applications to el...
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Format: | Livre numérique |
| Sprache: | Anglais |
| Veröffentlicht: |
Berlin, Heidelberg :
Springer Berlin Heidelberg
[20..].
Cham : Springer Nature |
| Ausgabe: | 2nd ed. 2010. |
| Schriftenreihe: | Springer Series in Advanced Microelectronics
10 |
| Online Zugang: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Anmerkung: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Lock-in Thermography, Basics and Use for Evaluating Electronic Devices and Materials, Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp, Second edition, Heidelberg, Springer, 2010, 1 vol. (X-255 p.), Springer Series in Advanced Microelectronics, 978-3-642-02416-0 • Lock-in Thermography, Texte imprimé, 9783642024184 • Lock-in Thermography, Texte imprimé, 9783642264788 |
Inhaltsangabe:
- Introduction Physical and Technical Basics Timing Strategies Heat Dissipation Mechanisms in Solar Cells Carrier Density Imaging Illuminated Lock-in Thermography (ILIT) Experimental Technique Theory Measurement Strategies Typical Applications Summary and Outlook