Lock-in thermography : basics and use for evaluating electronic devices and materials
This book deals with lock-in thermography (LIT) as a special active dynamic variant of the well-known IR thermography. It enables a much improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. The book concentrates on applications to el...
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| Auteurs principaux: | , , |
|---|---|
| Format: | Livre numérique |
| Sprog: | Anglais |
| Udgivet: |
Berlin, Heidelberg :
Springer Berlin Heidelberg
[20..].
Cham : Springer Nature |
| Udgivelse: | 2nd ed. 2010. |
| Serier: | Springer Series in Advanced Microelectronics
10 |
| Online adgang: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Kommentar: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Lock-in Thermography, Basics and Use for Evaluating Electronic Devices and Materials, Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp, Second edition, Heidelberg, Springer, 2010, 1 vol. (X-255 p.), Springer Series in Advanced Microelectronics, 978-3-642-02416-0 • Lock-in Thermography, Texte imprimé, 9783642024184 • Lock-in Thermography, Texte imprimé, 9783642264788 |
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| 100 | 1 | |a Breitenstein, Otwin, |d 19..- | |
| 245 | 1 | 0 | |a Lock-in thermography : |b basics and use for evaluating electronic devices and materials |c by Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp. |
| 250 | |a 2nd ed. 2010. | ||
| 260 | |a Berlin, Heidelberg : |b Springer Berlin Heidelberg. | ||
| 260 | |a Cham : |b Springer Nature, |c [20..]. | ||
| 490 | 0 | |a Springer Series in Advanced Microelectronics |v 10 |x 2197-6643 | |
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 505 | 1 | |a Introduction Physical and Technical Basics Timing Strategies Heat Dissipation Mechanisms in Solar Cells Carrier Density Imaging Illuminated Lock-in Thermography (ILIT) Experimental Technique Theory Measurement Strategies Typical Applications Summary and Outlook | |
| 506 | |a Accès en ligne pour les établissements français bénéficiaires des licences nationales | ||
| 506 | |a Accès soumis à abonnement pour tout autre établissement | ||
| 506 | |a Conditions particulières de réutilisation pour les bénéficiaires des licences nationales. https://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 | ||
| 520 | |a This book deals with lock-in thermography (LIT) as a special active dynamic variant of the well-known IR thermography. It enables a much improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. The book concentrates on applications to electronic devices and materials, but the basic chapters are useful as well for non-destructive evaluation. Various experimental approaches to LIT are reviewed with special emphasis to different available commercial LIT systems. New LIT applications are reviewed, like Illuminated LIT applied to solar cells , and non-thermal LIT lifetime mapping. Typical LIT investigation case studies are introduced | ||
| 700 | 1 | |a Warta, Wilhelm, |d 19..- |4 aut | |
| 700 | 1 | |a Langenkamp, Martin, |d 1964- |4 aut | |
| 776 | 0 | |0 149988257 |t Lock-in Thermography |o Basics and Use for Evaluating Electronic Devices and Materials |f Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp |e Second edition |c Heidelberg |n Springer |d 2010 |p 1 vol. (X-255 p.) |s Springer Series in Advanced Microelectronics |z 978-3-642-02416-0 | |
| 776 | 0 | |t Lock-in Thermography |b Texte imprimé |z 9783642024184 | |
| 776 | 0 | |t Lock-in Thermography |b Texte imprimé |z 9783642264788 | |
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