Noncontact atomic force microscopy. Volume 2
Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and...
保存先:
| その他の著者: | , , |
|---|---|
| フォーマット: | Livre numérique |
| 言語: | Anglais |
| 出版事項: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Springer e-books
[20..].
Cham : Springer Nature |
| シリーズ: | NanoScience and Technology
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| オンライン･アクセス: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| 注記: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Noncontact atomic force microscopy, Volume 2, edited by Seizo Morita, Franz J. Giessible, Roland Wiesendanger, Berlin, Springer, 2009, 1 vol. (XVIII-401p. ), Nanoscience and technology, 978-3-642-01494-9 |
目次:
- Method for Precise Force Measurements Force Spectroscopy on Semiconductor Surfaces Tip#x2013;Sample Interactions as a Function of Distance on Insulating Surfaces Force Field Spectroscopy in Three Dimensions Principles and Applications of the qPlus Sensor Study of Thin Oxide Films with NC-AFM: Atomically Resolved Imaging and Beyond Atom Manipulation on Semiconductor Surfaces Atomic Manipulation on Metal Surfaces Atomic Manipulation on an Insulator Surface Basic Mechanisms for Single Atom Manipulation in Semiconductor Systems with the FM-AFM Multi-Scale Modelling of NC-AFM Imaging and Manipulation at Insulating Surfaces Magnetic Exchange Force Microscopy First-Principles Simulation of Magnetic Exchange Force Microscopy on Fe/W(001) Frequency Modulation Atomic Force Microscopy in Liquids Biological Applications of FM-AFM in Liquid Environment High-Frequency Low Amplitude Atomic Force Microscopy Cantilever Dynamics and Nonlinear Effects in Atomic Force Microscopy