Noncontact atomic force microscopy. Volume 2
Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and...
Kaydedildi:
| Diğer Yazarlar: | , , |
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| Materyal Türü: | Livre numérique |
| Dil: | Anglais |
| Baskı/Yayın Bilgisi: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Springer e-books
[20..].
Cham : Springer Nature |
| Seri Bilgileri: | NanoScience and Technology
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| Online Erişim: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Not: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Noncontact atomic force microscopy, Volume 2, edited by Seizo Morita, Franz J. Giessible, Roland Wiesendanger, Berlin, Springer, 2009, 1 vol. (XVIII-401p. ), Nanoscience and technology, 978-3-642-01494-9 |