Noncontact atomic force microscopy. Volume 2
Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and...
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| Formatua: | Livre numérique |
| Hizkuntza: | Anglais |
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Berlin, Heidelberg :
Springer Berlin Heidelberg : Springer e-books
[20..].
Cham : Springer Nature |
| Saila: | NanoScience and Technology
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| Edition sous un autre format: | • Noncontact atomic force microscopy, Volume 2, edited by Seizo Morita, Franz J. Giessible, Roland Wiesendanger, Berlin, Springer, 2009, 1 vol. (XVIII-401p. ), Nanoscience and technology, 978-3-642-01494-9 |
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| 245 | 0 | 0 | |a Noncontact atomic force microscopy. |n Volume 2 |c edited by Seizo Morita, Franz J. Giessibl, Roland Wiesendanger. |
| 260 | |a Berlin, Heidelberg : |b Springer Berlin Heidelberg : |b Springer e-books. | ||
| 260 | |a Cham : |b Springer Nature, |c [20..]. | ||
| 490 | 0 | |a NanoScience and Technology |x 1434-4904 | |
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 505 | 1 | |a Method for Precise Force Measurements Force Spectroscopy on Semiconductor Surfaces Tip#x2013;Sample Interactions as a Function of Distance on Insulating Surfaces Force Field Spectroscopy in Three Dimensions Principles and Applications of the qPlus Sensor Study of Thin Oxide Films with NC-AFM: Atomically Resolved Imaging and Beyond Atom Manipulation on Semiconductor Surfaces Atomic Manipulation on Metal Surfaces Atomic Manipulation on an Insulator Surface Basic Mechanisms for Single Atom Manipulation in Semiconductor Systems with the FM-AFM Multi-Scale Modelling of NC-AFM Imaging and Manipulation at Insulating Surfaces Magnetic Exchange Force Microscopy First-Principles Simulation of Magnetic Exchange Force Microscopy on Fe/W(001) Frequency Modulation Atomic Force Microscopy in Liquids Biological Applications of FM-AFM in Liquid Environment High-Frequency Low Amplitude Atomic Force Microscopy Cantilever Dynamics and Nonlinear Effects in Atomic Force Microscopy | |
| 506 | |a Accès en ligne pour les établissements français bénéficiaires des licences nationales | ||
| 506 | |a Accès soumis à abonnement pour tout autre établissement | ||
| 506 | |a Conditions particulières de réutilisation pour les bénéficiaires des licences nationales. https://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 | ||
| 520 | |a Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology | ||
| 700 | 1 | |a Morita, Seizo, |d 1948- |4 pbd | |
| 700 | 1 | |a Giessibl, Franz J. |4 pbd | |
| 700 | 1 | |a Wiesendanger, Roland, |d 1961-...., |c physicien. |4 pbd | |
| 776 | 0 | |0 139278990 |t Noncontact atomic force microscopy |h Volume 2 |f edited by Seizo Morita, Franz J. Giessible, Roland Wiesendanger |c Berlin |n Springer |d 2009 |p 1 vol. (XVIII-401p. ) |s Nanoscience and technology |z 978-3-642-01494-9 | |
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