Transmission Electron Microscopy : A Textbook for Materials Science
This groundbreaking text has been established as the market leader throughout the world. Now profusely illustrated with full color figures and diagrams throughout the text, Transmission Electron Microscopy: A Textbook for Materials Science, Second Edition, provides the necessary insight and guidance...
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| Główni autorzy: | , |
|---|---|
| Kolejni autorzy: | |
| Format: | Livre numérique |
| Język: | Anglais |
| Wydane: |
Boston, MA :
Springer US
[20..].
Cham : Springer Nature |
| Wydanie: | 2. |
| Hasła przedmiotowe: | |
| Dostęp online: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Komentarz: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Transmission Electron Microscopy, Texte imprimé, 9780387765006 |
Spis treści:
- Basics The Transmission Electron Microscope Scattering and Diffraction Elastic Scattering Inelastic Scattering and Beam Damage Electron Sources Lenses, Apertures, and Resolution How to See Electrons Pumps and Holders The Instrument Specimen Preparation Diffraction Diffraction in TEM Thinking in Reciprocal Space Diffracted Beams Bloch Waves Dispersion Surfaces Diffraction from Crystals Diffraction from Small Volumes Obtaining and Indexing Parallel-Beam Diffraction Patterns Kikuchi Diffraction Obtaining CBED Patterns Using Convergent-Beam Techniques Imaging Amplitude Contrast Phase-Contrast Images Thickness and Bending Effects Planar Defects Imaging Strain Fields Weak-Beam Dark-Field Microscopy High-Resolution TEM Other Imaging Techniques Image Simulation Processing and Quantifying Images Spectrometry X-ray Spectrometry X-ray Spectra and Images Qualitative X-ray Analysis and Imaging Quantitative X-ray Analysis Spatial Resolution and Minimum Detection Electron Energy-Loss Spectrometers and Filters Low-Loss and No-Loss Spectra and Images High Energy-Loss Spectra and Images Fine Structure and Finer Details.
- Basics
- Diffraction
- Imaging
- Spectrometry
- The Transmission Electron Microscope
- Scattering and Diffraction
- Elastic Scattering
- Inelastic Scattering and Beam Damage
- Electron Sources
- Lenses, Apertures, and Resolution
- How to See Electrons
- Pumps and Holders
- The Instrument
- Specimen Preparation
- Diffraction in TEM
- Thinking in Reciprocal Space
- Diffracted Beams
- Bloch Waves
- Dispersion Surfaces
- Diffraction from Crystals
- Diffraction from Small Volumes
- Obtaining and Indexing Parallel-Beam Diffraction Patterns
- Kikuchi Diffraction
- Obtaining CBED Patterns
- Using Convergent-Beam Techniques
- Amplitude Contrast
- Phase-Contrast Images
- Thickness and Bending Effects
- Planar Defects
- Imaging Strain Fields
- Weak-Beam Dark-Field Microscopy
- High-Resolution TEM
- Other Imaging Techniques
- Image Simulation
- Processing and Quantifying Images
- X-ray Spectrometry
- X-ray Spectra and Images
- Qualitative X-ray Analysis and Imaging
- Quantitative X-ray Analysis
- Spatial Resolution and Minimum Detection
- Electron Energy-Loss Spectrometers and Filters
- Low-Loss and No-Loss Spectra and Images
- High Energy-Loss Spectra and Images
- Fine Structure and Finer Details