Transmission Electron Microscopy : A Textbook for Materials Science
This groundbreaking text has been established as the market leader throughout the world. Now profusely illustrated with full color figures and diagrams throughout the text, Transmission Electron Microscopy: A Textbook for Materials Science, Second Edition, provides the necessary insight and guidance...
Gorde:
| Egile Nagusiak: | , |
|---|---|
| Beste egile batzuk: | |
| Formatua: | Livre numérique |
| Hizkuntza: | Anglais |
| Argitaratua: |
Boston, MA :
Springer US
[20..].
Cham : Springer Nature |
| Edizioa: | 2. |
| Gaiak: | |
| Sarrera elektronikoa: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Oharra: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Transmission Electron Microscopy, Texte imprimé, 9780387765006 |
| LEADER | 06551nam a22003737a 4500 | ||
|---|---|---|---|
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| 020 | |a 9780387765013 | ||
| 041 | 0 | |a eng | |
| 082 | |a 620.11 | ||
| 100 | 1 | |a Williams, David Bernard, |d 1949-...., |c spécialiste de métallurgie. | |
| 245 | 1 | 0 | |a Transmission Electron Microscopy : |b A Textbook for Materials Science |c by David B. Williams, C. Barry Carter. |
| 250 | |a 2. | ||
| 260 | |a Boston, MA : |b Springer US. | ||
| 260 | |a Cham : |b Springer Nature, |c [20..]. | ||
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 505 | 1 | |a Basics The Transmission Electron Microscope Scattering and Diffraction Elastic Scattering Inelastic Scattering and Beam Damage Electron Sources Lenses, Apertures, and Resolution How to See Electrons Pumps and Holders The Instrument Specimen Preparation Diffraction Diffraction in TEM Thinking in Reciprocal Space Diffracted Beams Bloch Waves Dispersion Surfaces Diffraction from Crystals Diffraction from Small Volumes Obtaining and Indexing Parallel-Beam Diffraction Patterns Kikuchi Diffraction Obtaining CBED Patterns Using Convergent-Beam Techniques Imaging Amplitude Contrast Phase-Contrast Images Thickness and Bending Effects Planar Defects Imaging Strain Fields Weak-Beam Dark-Field Microscopy High-Resolution TEM Other Imaging Techniques Image Simulation Processing and Quantifying Images Spectrometry X-ray Spectrometry X-ray Spectra and Images Qualitative X-ray Analysis and Imaging Quantitative X-ray Analysis Spatial Resolution and Minimum Detection Electron Energy-Loss Spectrometers and Filters Low-Loss and No-Loss Spectra and Images High Energy-Loss Spectra and Images Fine Structure and Finer Details. | |
| 505 | 0 | |a Basics -- Diffraction -- Imaging -- Spectrometry -- The Transmission Electron Microscope -- Scattering and Diffraction -- Elastic Scattering -- Inelastic Scattering and Beam Damage -- Electron Sources -- Lenses, Apertures, and Resolution -- How to See Electrons -- Pumps and Holders -- The Instrument -- Specimen Preparation -- Diffraction in TEM -- Thinking in Reciprocal Space -- Diffracted Beams -- Bloch Waves -- Dispersion Surfaces -- Diffraction from Crystals -- Diffraction from Small Volumes -- Obtaining and Indexing Parallel-Beam Diffraction Patterns -- Kikuchi Diffraction -- Obtaining CBED Patterns -- Using Convergent-Beam Techniques -- Amplitude Contrast -- Phase-Contrast Images -- Thickness and Bending Effects -- Planar Defects -- Imaging Strain Fields -- Weak-Beam Dark-Field Microscopy -- High-Resolution TEM -- Other Imaging Techniques -- Image Simulation -- Processing and Quantifying Images -- X-ray Spectrometry -- X-ray Spectra and Images -- Qualitative X-ray Analysis and Imaging -- Quantitative X-ray Analysis -- Spatial Resolution and Minimum Detection -- Electron Energy-Loss Spectrometers and Filters -- Low-Loss and No-Loss Spectra and Images -- High Energy-Loss Spectra and Images -- Fine Structure and Finer Details | |
| 506 | |a Accès en ligne pour les établissements français bénéficiaires des licences nationales | ||
| 506 | |a Accès soumis à abonnement pour tout autre établissement | ||
| 506 | |a Conditions particulières de réutilisation pour les bénéficiaires des licences nationales. https://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 | ||
| 520 | |a This groundbreaking text has been established as the market leader throughout the world. Now profusely illustrated with full color figures and diagrams throughout the text, Transmission Electron Microscopy: A Textbook for Materials Science, Second Edition, provides the necessary insight and guidance for successful hands-on application of this versatile and powerful materials characterization technique. For this first new edition in 12 years, many sections have been completely rewritten with all others revised and updated. The new edition also includes an extensive collection of questions for the student, providing approximately 800 for self-assessment and over 400 that are suitable for homework assignment. Key Features: Undisputed market leader, now completely revised and updated Ideal for use as a teaching text at the advanced undergraduate and graduate levels and as a hands-on reference for materials scientists Explains why a particular technique should be used and how a specific concept can be put into practice Nearly 700 figures and diagrams, most in full color Praise for the first edition: `The best textbook for this audience available.' American Scientist "...highly readable, and an extremely valuable text for all users of the TEM at every level. Treat yourself to a copy!" Microscopy and Microanalysis `This book is written in such a comprehensive manner that it is understandable to all people who are trained in physical science and it will be useful both for the expert as well as the student.' Micron `The book answers nearly any question - be it instrumental, practical, or theoretical - either directly or with an appropriate reference...This book provides a basic, clear-cut presentation of how transmission electron microscopes should be used and of how this depends specifically on one's specific undergoing project.' MRS Bulletin `The only complete text now available which includes all the remarkable advances made in the field of TEM in the past 30-40 years....The authors can be proud of an enormous task, very well done.' from the Foreword by Professor Gareth Thomas, University of California, Berkeley | ||
| 650 | |a Microscopie électronique en transmission | ||
| 650 | |a Matériaux |x Microscopie | ||
| 700 | 1 | |a Carter, C. Barry, |d 19..- |4 aut | |
| 700 | 1 | |a Spence, John C. H., |c physicien. |4 aui | |
| 776 | 0 | |t Transmission Electron Microscopy |b Texte imprimé |z 9780387765006 | |
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| 997 | |0 941828 |1 Livre numérique |a Ressource numérique |b INSA |b ENSA |c 0/Bibliothèque numérique/ |c 1/Bibliothèque numérique/Autre ressource numérique/ | ||