Functional design errors in digital circuits : diagnosis, correction and repair
Due to the dramatic increase in design complexity, modern circuits are often produced with functional errors. While improvements in verification allow engineers to find more errors, fixing these errors remains a manual and challenging task. Functional Design Errors in Digital Circuits Diagnosis cove...
Salvato in:
| Autori principali: | , , |
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| Natura: | Livre numérique |
| Lingua: | Anglais |
| Pubblicazione: |
Dordrecht :
Springer Netherlands : Springer e-books
[20..].
Cham : Springer Nature |
| Serie: | Lecture Notes in Electrical Engineering
32 |
| Accesso online: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Nota: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Functional Design Errors in Digital Circuits, Texte imprimé, 9781402093647 |
| Riassunto: | Due to the dramatic increase in design complexity, modern circuits are often produced with functional errors. While improvements in verification allow engineers to find more errors, fixing these errors remains a manual and challenging task. Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. In addition, Functional Design Errors in Digital Circuits Diagnosis describes a comprehensive evaluation of spare-cell insertion methods. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices |
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| Descrizione del documento: | Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| ISBN: | 9781402093654 |
| ISSN: | 1876-1100 |
| Accesso: | Accès en ligne pour les établissements français bénéficiaires des licences nationales Accès soumis à abonnement pour tout autre établissement Conditions particulières de réutilisation pour les bénéficiaires des licences nationales. https://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 |