Emerging nanotechnologies : test, defect tolerance, and reliability
"Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technolog...
Gorde:
| Beste egile batzuk: | |
|---|---|
| Formatua: | Livre numérique |
| Hizkuntza: | Anglais |
| Argitaratua: |
New York :
Springer US
[20..].
Cham : Springer Nature |
| Edizioa: | 1st ed. 2008. |
| Saila: | Frontiers in Electronic Testing
37 |
| Sarrera elektronikoa: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Oharra: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Emerging Nanotechnologies, Texte imprimé, 9780387520995 • Emerging Nanotechnologies, Texte imprimé, 9781441945136 • Emerging nanotechnologies, test, defect tolerance, and reliability, Mohammad Tehranipoor, editor, 2008, New York, Springer Verlag, 1 vol. (XII-405 p.), Frontiers in electronic testing, 978-0-387-74746-0 |