Emerging nanotechnologies : test, defect tolerance, and reliability

"Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technolog...

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書誌詳細
その他の著者: Tehranipoor, Mark, 1974- (出版デイレクター)
フォーマット: Livre numérique
言語:Anglais
出版事項: New York : Springer US [20..].
Cham : Springer Nature
版:1st ed. 2008.
シリーズ:Frontiers in Electronic Testing 37
オンライン・アクセス:Accès sur la plateforme de l'éditeur
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注記: Archives Springer e-books (Licence nationale)
Archives Springer e-books (Licence nationale)
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Edition sous un autre format:• Emerging Nanotechnologies, Texte imprimé, 9780387520995
• Emerging Nanotechnologies, Texte imprimé, 9781441945136
• Emerging nanotechnologies, test, defect tolerance, and reliability, Mohammad Tehranipoor, editor, 2008, New York, Springer Verlag, 1 vol. (XII-405 p.), Frontiers in electronic testing, 978-0-387-74746-0
その他の書誌記述
要約:"Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality. Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field."
記述事項:Archives Springer e-books (Licence nationale)
Archives Springer e-books (Licence nationale)
ISBN:9780387747477
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