Emerging nanotechnologies : test, defect tolerance, and reliability
"Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technolog...
Sparad:
| Övriga upphovsmän: | |
|---|---|
| Materialtyp: | Livre numérique |
| Språk: | Anglais |
| Publicerad: |
New York :
Springer US
[20..].
Cham : Springer Nature |
| Upplaga: | 1st ed. 2008. |
| Serie: | Frontiers in Electronic Testing
37 |
| Länkar: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Anmärkning: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Emerging Nanotechnologies, Texte imprimé, 9780387520995 • Emerging Nanotechnologies, Texte imprimé, 9781441945136 • Emerging nanotechnologies, test, defect tolerance, and reliability, Mohammad Tehranipoor, editor, 2008, New York, Springer Verlag, 1 vol. (XII-405 p.), Frontiers in electronic testing, 978-0-387-74746-0 |
| LEADER | 04103nam a22003497a 4500 | ||
|---|---|---|---|
| 001 | 940070 | ||
| 008 | 080505q2000 xx ||| |||| 00| 0 eng d | ||
| 009 | PPN123737222 | ||
| 020 | |a 9780387747477 | ||
| 041 | 0 | |a eng | |
| 082 | |a 621.3815 | ||
| 245 | 0 | 0 | |a Emerging nanotechnologies : |b test, defect tolerance, and reliability |c edited by Mohammad Tehranipoor. |
| 250 | |a 1st ed. 2008. | ||
| 260 | |a New York : |b Springer US. | ||
| 260 | |a Cham : |b Springer Nature, |c [20..]. | ||
| 490 | 0 | |a Frontiers in Electronic Testing |v 37 | |
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 505 | 1 | |a Test and Defect Tolerance for Crossbar-Based Architectures Defect-Tolerant Logic with Nanoscale Crossbar Circuits Built-in Self-Test and Defect Tolerance in Molecular Electronics-Based Nanofabrics Test and Defect Tolerance for Reconfigurable Nanoscale Devices A Built-In Self-Test and Diagnosis Strategy for Chemically-Assembled Electronic Nanotechnology Defect Tolerance in Crossbar Array Nano-Architectures Test and Defect Tolerance for QCA Circuits Reversible and Testable Circuits for Molecular QCA Design Cellular Array-Based Delay-Insensitive Asynchronous Circuits Design and Test for Nanocomputing Systems QCA Circuits for Robust Coplanar Crossing Reliability and Defect Tolerance in Metallic Quantum-Dot Cellular Automata Testing Microfluidic Biochips Test Planning and Test Resource Optimization for Droplet-Based Microfluidic Systems Testing and Diagnosis of Realistic Defects in Digital Microfluidic Biochips Reliability for Nanotechnology Devices Designing Nanoscale Logic Circuits Based on Principles of Markov Random Fields Towards Nanoelectronics Processor Architectures Design and Analysis of Fault-Tolerant Molecular Computing Systems. | |
| 506 | |a Accès en ligne pour les établissements français bénéficiaires des licences nationales | ||
| 506 | |a Accès soumis à abonnement pour tout autre établissement | ||
| 506 | |a Conditions particulières de réutilisation pour les bénéficiaires des licences nationales. https://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 | ||
| 520 | |a "Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality. Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field." | ||
| 700 | 1 | |a Tehranipoor, Mark, |d 1974- |4 pbd | |
| 776 | 0 | |t Emerging Nanotechnologies |b Texte imprimé |z 9780387520995 | |
| 776 | 0 | |t Emerging Nanotechnologies |b Texte imprimé |z 9781441945136 | |
| 776 | 0 | |0 128093560 |t Emerging nanotechnologies |o test, defect tolerance, and reliability |f Mohammad Tehranipoor, editor |d 2008 |c New York |n Springer Verlag |p 1 vol. (XII-405 p.) |s Frontiers in electronic testing |z 978-0-387-74746-0 | |
| 856 | 4 | |q PDF |u https://doi.org/10.1007/978-0-387-74747-7 |z Accès sur la plateforme de l'éditeur | |
| 856 | 4 | |u https://revue-sommaire.istex.fr/ark:/67375/8Q1-6QDCB5WZ-9 |z Accès sur la plateforme Istex | |
| 856 | 4 | |5 452349901:747864985 |u https://ezproxy.univ-orleans.fr/login?url=https://dx.doi.org/10.1007/978-0-387-74747-7 |z Accès Université d'Orléans | |
| 856 | 4 | |5 180339901:750882573 |u https://ezproxy.insa-cvl.fr/login?qurl=https://dx.doi.org/10.1007/978-0-387-74747-7 |z Accès INSA CVL | |
| 997 | |0 940070 |1 Livre numérique |a Ressource numérique |b INSA |b ENSA |c 0/Bibliothèque numérique/ |c 1/Bibliothèque numérique/Autre ressource numérique/ | ||