Design for manufacturability and statistical design : a constructive approach

Design for Manufacturability and Statistical Design: A Constructive Approach provides a thorough treatment of the causes of variability, methods for statistical data characterization, and techniques for modeling, analysis, and optimization of integrated circuits to improve yield. The objective of th...

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Detalles Bibliográficos
Auteurs principaux: Orshansky, Michael, Boning, Duane S. (Auteur), Nassif, Sani R. (Auteur)
Formato: Livre numérique
Idioma:Anglais
Publicado: New York, NY : Springer US [20..].
Cham : Springer Nature
Edición:1st ed. 2008.
Series:Integrated Circuits and Systems
Acceso en liña:Accès sur la plateforme de l'éditeur
Accès sur la plateforme Istex
Accès Université d'Orléans
Accès INSA CVL
Nota: Archives Springer e-books (Licence nationale)
Archives Springer e-books (Licence nationale)
Autres localisations: Voir dans le Sudoc
Edition sous un autre format:• Synthesizing synchronous systems by static scheduling in space-time, Björn Lisper, Berlin, Springer-Verlag, 1989, 1 vol. (VI-262 p.), Lecture notes in computer science, 3-540-51156-3
• Design for Manufacturability and Statistical Design, Texte imprimé, 9781441940445
• Design for Manufacturability and Statistical Design, Texte imprimé, 9780387309286
Table des matières:
  • Sources of Variability Front End Variability Back End Variability Environmental Variability Variability Characterization and Analysis Test Structures For Variability Statistical Foundations Of Data Analysis And Modeling Design Techniques for Systematic Manufacturability Problems Lithography Enhancement Techniques Ensuring Interconnect Planarity Statistical Circuit Design Statistical Circuit Analysis Statistical Static Timing Analysis Leakage Variability And Joint Parametric Yield Parametric Yield Optimization Conclusions.