Thin Films of Soft Matter

A detailed overview and comprehensive analysis of the main theoretical and experimental advances on free surface thin film and jet flows of soft matter is given. At the theoretical front the book outlines the basic equations and boundary conditions and the derivation of low-dimensional models for th...

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Guardat en:
Dades bibliogràfiques
Autor principal: Kalliadasis, Serafim
Altres autors: Thiele, Uwe, 19..-...., auteur en physique de la matière condensée (Director editorial)
Format: Livre numérique
Idioma:Anglais
Publicat: Vienna : Springer Vienna [20..].
Cham : Springer Nature
Edició:1st ed. 2007.
Col·lecció:CISM International Centre for Mechanical Sciences, Courses and Lectures 490
Accés en línia:Accès sur la plateforme de l'éditeur
Accès sur la plateforme Istex
Accès Université d'Orléans
Accès INSA CVL
Nota: Archives Springer e-books (Licence nationale)
Archives Springer e-books (Licence nationale)
Autres localisations: Voir dans le Sudoc
Edition sous un autre format:• Thin Films of Soft Matter, Texte imprimé, 9783211100622
• Thin Films of Soft Matter, Texte imprimé, 9783211698075
Descripció
Sumari:A detailed overview and comprehensive analysis of the main theoretical and experimental advances on free surface thin film and jet flows of soft matter is given. At the theoretical front the book outlines the basic equations and boundary conditions and the derivation of low-dimensional models for the evolution of the free surface. Such models include long-wave expansions and equations of the boundary layer type and are analyzed via linear stability analysis, weakly nonlinear theories and strongly nonlinear analysis including construction of stationary periodic and solitary wave and similarity solutions. At the experimental front a variety of very recent experimental developments is outlined and the link between theory and experiments is illustrated. Such experiments include spreading drops and bubbles, imbibitions, singularity formation at interfaces and experimental characterization of thin films using atomic force microscopy, ellipsometry and contact angle measurements and analysis of patterns using Minkowski functionals.
Descripció de l’ítem:Archives Springer e-books (Licence nationale)
Archives Springer e-books (Licence nationale)
ISBN:9783211698082
ISSN:2309-3706
Accés:Accès en ligne pour les établissements français bénéficiaires des licences nationales
Accès soumis à abonnement pour tout autre établissement
Conditions particulières de réutilisation pour les bénéficiaires des licences nationales. https://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017