Scanning Probe Microscopy : :: SCD d'Orléans

Scanning Probe Microscopy : Electrical and Electromechanical Phenomena at the Nanoscale

Scanning Probe Microscopy : Electrical and Electromechanical Phenomena at the Nanoscale

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書誌詳細
その他の著者:	Kalinin, Sergei V. (出版デイレクター), Gruverman, Alexei, 19..- (出版デイレクター)
フォーマット:	Livre numérique
言語:	Anglais
出版事項:	New York, NY : Springer Science+Business Media, LLC : Springer e-books [20..]. Cham : Springer Nature
オンライン･アクセス:	Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL
注記:	Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale)
Autres localisations:	Voir dans le Sudoc

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