Applied scanning probe methods. IV, Industrial applications

The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At ?rstthere were two the ScanningTunnelingMicroscope,or STM,andtheAtomicForceMic- scope, or AFM. The...

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Detalles Bibliográficos
Autor Principal: Bhushan, Bharat
Outros autores: Fuchs, Harald (Directeur de la publication)
Formato: Livre numérique
Idioma:Anglais
Publicado: Berlin, Heidelberg : Springer Berlin Heidelberg [20..].
Cham : Springer Nature
Edición:1st ed. 2006.
Series:NanoScience and Technology
Acceso en liña:Accès sur la plateforme de l'éditeur
Accès sur la plateforme Istex
Accès Université d'Orléans
Accès INSA CVL
Nota: Archives Springer e-books (Licence nationale)
Archives Springer e-books (Licence nationale)
Autres localisations: Voir dans le Sudoc
Edition sous un autre format:• Applied scanning probe methods IV, industrial applications, edited by Bharat Bhushan, Harald Fuchs, Berlin, Springer, 2006, Nanoscience and technology, 3-540-26912-6
• Applied Scanning Probe Methods IV, Texte imprimé, 9783642065972
• Applied Scanning Probe Methods IV, Texte imprimé, 9783540812661
Table des matières:
  • Scanning Probe Lithography for Chemical, Biological and Engineering Applications Nanotribological Characterization of Human Hair and Skin Using Atomic Force Microscopy (AFM) Nanofabrication with Self-Assembled Monolayers by Scanning Probe Lithography Fabrication of Nanometer-Scale Structures by Local Oxidation Nanolithography Template Effects of Molecular Assemblies Studied by Scanning Tunneling Microscopy (STM) Microfabricated Cantilever Array Sensors for (Bio-)Chemical Detection Nano-Thermomechanics: Fundamentals and Application in Data Storage Devices Applications of Heated Atomic Force Microscope Cantilevers