Scanning probe microscopy : atomic scale engineering by forces and currents
Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today s simulation techniques and gives...
Salvato in:
| Autori principali: | , |
|---|---|
| Natura: | Livre numérique |
| Lingua: | Anglais |
| Pubblicazione: |
New York, NY :
Springer New York
[20..].
Cham : Springer Nature |
| Edizione: | 1st ed. 2006. |
| Serie: | NanoScience and Technology
|
| Accesso online: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Nota: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Scanning probe microscopy, atomic scale engineering by forces and currents, A. Foster, W. Hofer, New York, Springer Science+Business, 2006, 1 vol. (XIV-281 p.), Nanoscience and technology, 0-387-40090-7 |
Sommario:
- The Physics of Scanning Probe Microscopes SPM: The Instrument Theory of Forces Electron Transport Theory Transport in the Low Conductance Regime Bringing Theory to Experiment in SFM Topographic images Single-Molecule Chemistry Current and Force Spectroscopy Outlook