Scanning probe microscopy : atomic scale engineering by forces and currents

Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today s simulation techniques and gives...

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Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς: Foster, Adam Stuart, 1975-, Hofer, Werner A., 1960- (Συγγραφέας)
Μορφή: Livre numérique
Γλώσσα:Anglais
Έκδοση: New York, NY : Springer New York [20..].
Cham : Springer Nature
Έκδοση:1st ed. 2006.
Σειρά:NanoScience and Technology
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Σημείωση: Archives Springer e-books (Licence nationale)
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Edition sous un autre format:• Scanning probe microscopy, atomic scale engineering by forces and currents, A. Foster, W. Hofer, New York, Springer Science+Business, 2006, 1 vol. (XIV-281 p.), Nanoscience and technology, 0-387-40090-7
Περιγραφή
Περίληψη:Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today s simulation techniques and gives examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations used in today s research, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the instrument's operation is changed by materials properties; theorists will understand how simulations can be directly compared to experimental data
Περιγραφή τεκμηρίου:Archives Springer e-books (Licence nationale)
Archives Springer e-books (Licence nationale)
ISBN:9780387372310
ISSN:2197-7127
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