Scanning probe microscopy : atomic scale engineering by forces and currents
Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today s simulation techniques and gives...
Guardat en:
| Autors principals: | , |
|---|---|
| Format: | Livre numérique |
| Idioma: | Anglais |
| Publicat: |
New York, NY :
Springer New York
[20..].
Cham : Springer Nature |
| Edició: | 1st ed. 2006. |
| Col·lecció: | NanoScience and Technology
|
| Accés en línia: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Nota: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Scanning probe microscopy, atomic scale engineering by forces and currents, A. Foster, W. Hofer, New York, Springer Science+Business, 2006, 1 vol. (XIV-281 p.), Nanoscience and technology, 0-387-40090-7 |