Scanning probe microscopy : atomic scale engineering by forces and currents
Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today s simulation techniques and gives...
Shranjeno v:
| Auteurs principaux: | , |
|---|---|
| Format: | Livre numérique |
| Jezik: | Anglais |
| Izdano: |
New York, NY :
Springer New York
[20..].
Cham : Springer Nature |
| Izdaja: | 1st ed. 2006. |
| Serija: | NanoScience and Technology
|
| Online dostop: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Sporočilo: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Scanning probe microscopy, atomic scale engineering by forces and currents, A. Foster, W. Hofer, New York, Springer Science+Business, 2006, 1 vol. (XIV-281 p.), Nanoscience and technology, 0-387-40090-7 |
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| 100 | 1 | |a Foster, Adam Stuart, |d 1975- | |
| 245 | 1 | 0 | |a Scanning probe microscopy : |b atomic scale engineering by forces and currents |c by Adam Foster, Werner Hofer. |
| 250 | |a 1st ed. 2006. | ||
| 260 | |a New York, NY : |b Springer New York. | ||
| 260 | |a Cham : |b Springer Nature, |c [20..]. | ||
| 490 | 0 | |a NanoScience and Technology |x 2197-7127 | |
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 505 | 1 | |a The Physics of Scanning Probe Microscopes SPM: The Instrument Theory of Forces Electron Transport Theory Transport in the Low Conductance Regime Bringing Theory to Experiment in SFM Topographic images Single-Molecule Chemistry Current and Force Spectroscopy Outlook | |
| 506 | |a Accès en ligne pour les établissements français bénéficiaires des licences nationales | ||
| 506 | |a Accès soumis à abonnement pour tout autre établissement | ||
| 506 | |a Conditions particulières de réutilisation pour les bénéficiaires des licences nationales. https://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 | ||
| 520 | |a Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today s simulation techniques and gives examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations used in today s research, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the instrument's operation is changed by materials properties; theorists will understand how simulations can be directly compared to experimental data | ||
| 700 | 1 | |a Hofer, Werner A., |d 1960- |4 aut | |
| 776 | 0 | |0 109040996 |t Scanning probe microscopy |o atomic scale engineering by forces and currents |f A. Foster, W. Hofer |c New York |n Springer Science+Business |d 2006 |p 1 vol. (XIV-281 p.) |s Nanoscience and technology |z 0-387-40090-7 | |
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