Microscopy of semiconducting materials : proceedings of the 14th Conference, April 11 14, 2005, Oxford, UK
This is a long-established international biennial conference series, organised in conjunction with the Royal Microscopical Society, Oxford, the Institute of Physics, London and the Materials Research Society, USA. The 14th conference in the series focused on the most recent advances in the study of...
Gorde:
| Beste egile batzuk: | , |
|---|---|
| Formatua: | Livre numérique |
| Hizkuntza: | Anglais |
| Argitaratua: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Springer e-books
[20..].
Cham : Springer Nature |
| Saila: | Springer Proceedings in Physics
107 |
| Sarrera elektronikoa: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Oharra: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Microscopy of semiconducting materials, proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK, A.G. Cullis, J.L. Hutchison, (eds.), Berlin, Springer, 2005, 1 vol. (XVI-537 p.), Springer proceedings in physics, 3-540-31914-X |
Aurkibidea:
- Epitaxy: Wide Band-Gap Nitrides Epitaxy: Silicon-Germanium Alloys Epitaxy: Growth and Defect Phenomena High Resolution Microscopy and Nanoanalysis Self-Organised and Quantum Domain Structures Processed Silicon and Other Device Materials Device Studies Scanning Electron and Scanning Probe Advances