Microscopy of semiconducting materials : proceedings of the 14th Conference, April 11 14, 2005, Oxford, UK

This is a long-established international biennial conference series, organised in conjunction with the Royal Microscopical Society, Oxford, the Institute of Physics, London and the Materials Research Society, USA. The 14th conference in the series focused on the most recent advances in the study of...

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Bibliografiska uppgifter
Övriga upphovsmän: Cullis, Anthony G. (Chefredaktör, huvudredaktör), Hutchison, J. L. (Chefredaktör, huvudredaktör)
Materialtyp: Livre numérique
Språk:Anglais
Publicerad: Berlin, Heidelberg : Springer Berlin Heidelberg : Springer e-books [20..].
Cham : Springer Nature
Serie:Springer Proceedings in Physics 107
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Anmärkning: Archives Springer e-books (Licence nationale)
Archives Springer e-books (Licence nationale)
Autres localisations: Voir dans le Sudoc
Edition sous un autre format:• Microscopy of semiconducting materials, proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK, A.G. Cullis, J.L. Hutchison, (eds.), Berlin, Springer, 2005, 1 vol. (XVI-537 p.), Springer proceedings in physics, 3-540-31914-X
Beskrivning
Sammanfattning:This is a long-established international biennial conference series, organised in conjunction with the Royal Microscopical Society, Oxford, the Institute of Physics, London and the Materials Research Society, USA. The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques were also covered and included the latest work using scanning probe microscopy and also X-ray topography and diffraction. Developments in materials science and technology covering the complete range of elemental and compound semiconductors are described in this volume
Beskrivning:Archives Springer e-books (Licence nationale)
Archives Springer e-books (Licence nationale)
ISBN:9783540319153
ISSN:0930-8989
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