Microscopy of semiconducting materials : proceedings of the 14th Conference, April 11 14, 2005, Oxford, UK
This is a long-established international biennial conference series, organised in conjunction with the Royal Microscopical Society, Oxford, the Institute of Physics, London and the Materials Research Society, USA. The 14th conference in the series focused on the most recent advances in the study of...
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| 其他作者: | , |
|---|---|
| 格式: | Livre numérique |
| 语言: | Anglais |
| 出版: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Springer e-books
[20..].
Cham : Springer Nature |
| 丛编: | Springer Proceedings in Physics
107 |
| 在线阅读: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
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| Edition sous un autre format: | • Microscopy of semiconducting materials, proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK, A.G. Cullis, J.L. Hutchison, (eds.), Berlin, Springer, 2005, 1 vol. (XVI-537 p.), Springer proceedings in physics, 3-540-31914-X |
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| 245 | 0 | 0 | |a Microscopy of semiconducting materials : |b proceedings of the 14th Conference, April 11 14, 2005, Oxford, UK |c edited by A. G. Cullis, J. L. Hutchison. |
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| 260 | |a Cham : |b Springer Nature, |c [20..]. | ||
| 490 | 0 | |a Springer Proceedings in Physics |v 107 |x 0930-8989 | |
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| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 505 | 1 | |a Epitaxy: Wide Band-Gap Nitrides Epitaxy: Silicon-Germanium Alloys Epitaxy: Growth and Defect Phenomena High Resolution Microscopy and Nanoanalysis Self-Organised and Quantum Domain Structures Processed Silicon and Other Device Materials Device Studies Scanning Electron and Scanning Probe Advances | |
| 506 | |a Accès en ligne pour les établissements français bénéficiaires des licences nationales | ||
| 506 | |a Accès soumis à abonnement pour tout autre établissement | ||
| 506 | |a Conditions particulières de réutilisation pour les bénéficiaires des licences nationales. https://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 | ||
| 520 | |a This is a long-established international biennial conference series, organised in conjunction with the Royal Microscopical Society, Oxford, the Institute of Physics, London and the Materials Research Society, USA. The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques were also covered and included the latest work using scanning probe microscopy and also X-ray topography and diffraction. Developments in materials science and technology covering the complete range of elemental and compound semiconductors are described in this volume | ||
| 700 | 1 | |a Cullis, Anthony G. |4 pbd | |
| 700 | 1 | |a Hutchison, J. L. |4 pbd | |
| 776 | 0 | |0 104421010 |t Microscopy of semiconducting materials |o proceedings of the 14th Conference |o April 11-14, 2005, Oxford, UK |f A.G. Cullis, J.L. Hutchison, (eds.) |c Berlin |n Springer |d 2005 |p 1 vol. (XVI-537 p.) |s Springer proceedings in physics |z 3-540-31914-X | |
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