Integrated Circuit Test Engineering : Modern Techniques
Nearly sixty years ago, the first successful demonstration of the transistor proved to be the herald of a new era of microelectronics. The ever-increasing complexity and functional speed of microelectronic circuits now containing tens of millions of transistors demand appropriate and rigorous test e...
Guardat en:
| Autor principal: | |
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| Format: | Livre numérique |
| Idioma: | Anglais |
| Publicat: |
London :
Springer London
2006.
Cham : Springer Nature |
| Col·lecció: | Engineering (Springer-11647; ZDB-2-ENG)
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| Matèries: | |
| Accés en línia: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Nota: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Integrated Circuit Test Engineering, Texte imprimé, 9781846280238 • Integrated Circuit Test Engineering, Texte imprimé, 9781848004092 |
Taula de continguts:
- to Integrated Circuit Test Engineering
- Fabrication Processes for Integrated Circuits
- Digital Logic Test
- Memory Test
- Analogue Test
- Mixed-Signal Test
- Input-Output Test
- Design for Testability Structured Test Approaches
- System on a Chip (SoC) Test
- Test Pattern Generation and Fault Simulation
- Automatic Test Equipment (ATE) and Production Test
- Test Economics.