Integrated Circuit Test Engineering : Modern Techniques
Nearly sixty years ago, the first successful demonstration of the transistor proved to be the herald of a new era of microelectronics. The ever-increasing complexity and functional speed of microelectronic circuits now containing tens of millions of transistors demand appropriate and rigorous test e...
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| Autor principal: | |
|---|---|
| Formato: | Livre numérique |
| Idioma: | Anglais |
| Publicado em: |
London :
Springer London
2006.
Cham : Springer Nature |
| Colecção: | Engineering (Springer-11647; ZDB-2-ENG)
|
| Assuntos: | |
| Acesso em linha: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Nota: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Integrated Circuit Test Engineering, Texte imprimé, 9781846280238 • Integrated Circuit Test Engineering, Texte imprimé, 9781848004092 |
| LEADER | 04510nam a22003377a 4500 | ||
|---|---|---|---|
| 001 | 937640 | ||
| 008 | 070403s2006 xx ||| |||| 00| 0 eng d | ||
| 009 | PPN113730365 | ||
| 020 | |a 9781846281730 (en ligne) | ||
| 041 | 0 | |a eng | |
| 082 | |a 6,213,815 | ||
| 100 | 1 | |a Grout, Ian A. | |
| 245 | 1 | 0 | |a Integrated Circuit Test Engineering : |b Modern Techniques |c Ian A. Grout. |
| 260 | |a London : |b Springer London. | ||
| 260 | |a Cham : |b Springer Nature, |c 2006. | ||
| 490 | 0 | |a Engineering (Springer-11647; ZDB-2-ENG) | |
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 505 | 0 | |a to Integrated Circuit Test Engineering -- Fabrication Processes for Integrated Circuits -- Digital Logic Test -- Memory Test -- Analogue Test -- Mixed-Signal Test -- Input-Output Test -- Design for Testability Structured Test Approaches -- System on a Chip (SoC) Test -- Test Pattern Generation and Fault Simulation -- Automatic Test Equipment (ATE) and Production Test -- Test Economics. | |
| 506 | |a Accès en ligne pour les établissements français bénéficiaires des licences nationales | ||
| 506 | |a Accès soumis à abonnement pour tout autre établissement | ||
| 506 | |a Conditions particulières de réutilisation pour les bénéficiaires des licences nationales. chttps://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 | ||
| 520 | |a Nearly sixty years ago, the first successful demonstration of the transistor proved to be the herald of a new era of microelectronics. The ever-increasing complexity and functional speed of microelectronic circuits now containing tens of millions of transistors demand appropriate and rigorous test engineering activities during development and production. Test engineering must also be more closely interwoven with microelectronic design. An understanding of circuit test engineering is vital to any student desiring a career involving any stage in the design or manufacture of integrated circuits. Taking a three-pronged approach dealing with test engineering from traditional-test, design and manufacturing view-points Integrated Circuit Test Engineering encapsulates the subject as it stands today. After an introduction covering background from basic testing rules to trends in technology, the reader learns about: fabrication processes; a diverse and complete range of detailed tests and procedures calculated to teach you all the tests you will require and how to choose which one(s) to use; how to design for testability; fault simulation; automatic test equipment and the economics of testing. From a practical perspective, the text includes: A range of worked examples and exercises together with well-organized references and bibliography to aid further enquiry. An introduction to various software such as MATLAB® and Spice explaining their use in testing together with that of IEEE-standard hardware-description languages Verilog®-HDL and VHDL. A series of experiments based on material which can be freely downloaded from springeronline.com instructing you in the construction of a hardware test arrangement for MS Windows PCs (functionality, schematic andprinted-circuit-board layout)with Visual Basic programs to drive the experiments. Integrated Circuit Test Engineering provides a thorough-going and illuminating introduction to test engineering in analogue, digital and mixed-signal integrated circuits. This text is a valuable practical learning tool for advanced undergraduate and graduate electronic engineering students, an excellent teaching resource for their tutors and a useful guide for the practising electronic engineer. | ||
| 650 | |a Circuits intégrés |x Essais | ||
| 776 | 0 | |t Integrated Circuit Test Engineering |b Texte imprimé |z 9781846280238 | |
| 776 | 0 | |t Integrated Circuit Test Engineering |b Texte imprimé |z 9781848004092 | |
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