Fringe 2005 : the 5th international workshop on automatic processing of fringe patterns
The purpose of the Fringe Proceedings is to present to engineers, scientists and industrial experts the state-of-the-art and the impact of Computer aided Evaluation in Structured Light Techniques, Holographic Interferometry, Classic Interferometry, Speckle Metrology, Moiré and Grid Techniques for St...
সংরক্ষণ করুন:
| সংস্থা লেখক: | |
|---|---|
| অন্যান্য লেখক: | |
| বিন্যাস: | Livre numérique |
| ভাষা: | Anglais |
| প্রকাশিত: |
Berlin, Heidelberg :
Springer Berlin Heidelberg
[20..].
Cham : Springer Nature |
| সংস্করন: | 1st ed. 2006. |
| বিষয়গুলি: | |
| অনলাইন ব্যবহার করুন: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| টীকা: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Fringe 2005, Texte imprimé, 9783540260370 |
| সংক্ষিপ্ত: | The purpose of the Fringe Proceedings is to present to engineers, scientists and industrial experts the state-of-the-art and the impact of Computer aided Evaluation in Structured Light Techniques, Holographic Interferometry, Classic Interferometry, Speckle Metrology, Moiré and Grid Techniques for Stress Analysis, Nondestructive Testing, Shape Measurement, Fault Detection, Quality Control and related fields. Topics of particular interest are: Advanced Computer Aided Measurement Techniques; Resolution Enhanced Technologies in Optical Metrology; New approaches in Wide Scale 4D Optical Metrology; Sophisticated Sensors Systems and their applications for the solution of challenging measurement problems. Special emphasis is put on modern Measurement Strategies taking into account the active combination of Physical Modeling, Computer Aided Simulation and Experimental Data Acquisition. Further attention is directed to new approaches for the Extension of Existing Resolution Limits that open the gates to Wide Scale Metrology ranging from nano to macro by using Advanced Optical Sensor Systems |
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| উপাদানের বিবরণ: | Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| গ্রন্থ-পঞ্জী: | Références bibliogr. en fin de contributions |
| আইসবিএন: | 3540293035 (en ligne) 9783540293033 (en ligne) |
| প্রবেশাধিকার: | Accès en ligne pour les établissements français bénéficiaires des licences nationales Accès soumis à abonnement pour tout autre établissement Conditions particulières de réutilisation pour les bénéficiaires des licences nationales. https://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 |