The physics of SiO2 : :: SCD d'Orléans

The physics of SiO2 : and its interfaces : proceedings of the International Topical Conference on the Physics of Si02 and Its Interfaces, held at the IBM Thomas J. Watson Research Center, Yorktown Heights, New York, March 22-24, 1978

The physics of SiO2 : and its interfaces : proceedings of the International Topical Conference on the Physics of Si02 and Its Interfaces, held at the IBM Thomas J. Watson Research Center, Yorktown Heights, New York, March 22-24, 1978

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Détails bibliographiques
Collectivité auteur:	International Topical Conference on the Physics of SiO2 and Its Interfaces :Yorktown Heights, N.Y., U.S.A.
Autres auteurs:	Pantelides, Sokrates T., 1948- (Directeur de la publication)
Format:	Livre papier
Langue:	Anglais
Publié:	New York ; Oxford ; Paris [etc.] : Pergamon Press C 1978.
Sujets:	Silice Surfaces (physique) Chimie des surfaces Actes de congrès
Autres localisations:	Voir dans le Sudoc

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