The physics of SiO2 : and its interfaces : proceedings of the International Topical Conference on the Physics of Si02 and Its Interfaces, held at the IBM Thomas J. Watson Research Center, Yorktown Heights, New York, March 22-24, 1978
Enregistré dans:
| Institution som forfatter: | |
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| Andre forfattere: | |
| Format: | Livre papier |
| Sprog: | Anglais |
| Udgivet: |
New York ; Oxford ; Paris [etc.] :
Pergamon Press
C 1978.
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| Fag: | |
| Autres localisations: | Voir dans le Sudoc |
| Fysisk beskrivelse: | 1 vol. (XI-488 p.) : ill. ; 27 cm. |
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| Bibliografi: | Notes bibliogr. Index |
| ISBN: | 0080230490 (rel.) |