Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices
A discussion of recently developed experimental methods for noise research in nanoscale electronic devices, conducted by specialists in transport and stochastic phenomena in nanoscale physics. The approach described is to create methods for experimental observations of noise sources, their localizat...
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| Κύριος συγγραφέας: | |
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| Άλλοι συγγραφείς: | |
| Μορφή: | Livre numérique |
| Γλώσσα: | Anglais |
| Έκδοση: |
Dordrecht :
Springer Netherlands
2004.
Cham : Springer Nature |
| Έκδοση: | 1st ed. 2004. |
| Σειρά: | NATO Science Series II: Mathematics, Physics and Chemistry, Mathematics, Physics and Chemistry
151 |
| Θέματα: | |
| Διαθέσιμο Online: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Σημείωση: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Variante du titre: | Proceedings of the NATO Advanced Research Workshop, held in Brno, Czech Republic, 14-16 August 2003 |
| Edition sous un autre format: | • Advanced experimental methods for noise research in nanoscale electronic devices, [proceedings of the NATO advanced research workshop on Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices, Brno, Czech Republic, 14-16 August 2003], ed. by Josef Sikula,... and Michael Levinshtein,..., Dordrecht, Kluwer Academic Publishers, 2004, 1 vol. (IX-367 p.), NATO science series, 1-4020-2169-0 |
| Περίληψη: | A discussion of recently developed experimental methods for noise research in nanoscale electronic devices, conducted by specialists in transport and stochastic phenomena in nanoscale physics. The approach described is to create methods for experimental observations of noise sources, their localization and their frequency spectrum, voltage-current and thermal dependences. Our current knowledge of measurement methods for mesoscopic devices is summarized to identify directions for future research, related to downscaling effects. The directions for future research into fluctuation phenomena in quantum dot and quantum wire devices are specified. Nanoscale electronic devices will be the basic components for electronics of the 21st century. From this point of view the signal-to-noise ratio is a very important parameter for the device application. Since the noise is also a quality and reliability indicator, experimental methods will have a wide application in the future |
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| Περιγραφή τεκμηρίου: | Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Μορφή: | Nécessite un lecteur de fichier PDF |
| ISBN: | 9781402021701 |