Matching Properties of Deep Sub-Micron MOS Transistors
Matching Properties of Deep Sub-Micron MOS Transistors examines this interesting phenomenon. Microscopic fluctuations cause stochastic parameter fluctuations that affect the accuracy of the MOSFET. For analog circuits this determines the trade-off between speed, power, accuracy and yield. Furthermor...
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| Auteur principal: | |
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| Autres auteurs: | , |
| Format: | Livre numérique |
| Langue: | Anglais |
| Publié: |
New York, NY :
Springer US
2005.
Cham : Springer Nature |
| Édition: | 1st ed. 2005. |
| Collection: | The Springer International Series in Engineering and Computer Science
851 |
| Accès en ligne: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Note: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Matching properties of deep sub-micron MOS transistors, by Jeroen A. Croon,... Willy Sansen,... and Herman E. Maes,..., Dordrecht, Springer, 2005, 1 volume (X-206 p., The Kluwer international series in engineering and computer science, 0-387-24314-3 • Matching Properties of Deep Sub-Micron MOS Transistors, Texte imprimé, 9781441937186 • New institutional arrangements for the world economy, Hans-Jürgen Vosgerau (ed.), Berlin, Springer-Verlag, 1989, 1 vol. (IX-482 p.), Studies in international economics and institutions, 0-387-50480-X • Matching properties of deep sub-micron MOS transistors, by Jeroen A. Croon,... Willy Sansen,... and Herman E. Maes,..., Dordrecht, Springer, 2005, 1 volume (X-206 p., The Kluwer international series in engineering and computer science, 0-387-24314-3 • Matching Properties of Deep Sub-Micron MOS Transistors, Texte imprimé, 9781441937186 • New institutional arrangements for the world economy, Hans-Jürgen Vosgerau (ed.), Berlin, Springer-Verlag, 1989, 1 vol. (IX-482 p.), Studies in international economics and institutions, 0-387-50480-X • Matching properties of deep sub-micron MOS transistors, by Jeroen A. Croon,... Willy Sansen,... and Herman E. Maes,..., Dordrecht, Springer, 2005, 1 volume (X-206 p., The Kluwer international series in engineering and computer science, 0-387-24314-3 |