Yield and Variability Optimization of Integrated Circuits :: SCD d'Orléans

Yield and Variability Optimization of Integrated Circuits

Yield and Variability Optimization of Integrated Circuits

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Dades bibliogràfiques
Autors principals:	Zhang, J. C., Styblinski, M. A. (Autor)
Format:	Livre numérique
Idioma:	Anglais
Publicat:	Cham : Springer International Publishing [20..]. Cham : Springer Nature
Accés en línia:	Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL
Nota:	Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale)
Autres localisations:	Voir dans le Sudoc
Edition sous un autre format:	• Yield and Variability Optimization of Integrated Circuits, 978-1-4613-5935-7

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