Mewes, D., & Lehner, M. Applied Optical Measurements. Springer International Publishing.
Style de citation Chicago (17e éd.)Mewes, Dieter, et Markus Lehner. Applied Optical Measurements. Cham: Springer International Publishing.
Style de citation MLA (8e éd.)Mewes, Dieter, et Markus Lehner. Applied Optical Measurements. Springer International Publishing.
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