Interfacial Compatibility in Microelectronics : Moving Away from the Trial and Error Approach

Interfaces between dissimilar materials are met everywhere in microelectronics and microsystems. In order to ensure faultless operation of these highly sophisticated structures, it is mandatory to have fundamental understanding of materials and their interactions in the system. In this difficult tas...

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Detalles Bibliográficos
Autores principales: Laurila, Tomi, Vuorinen, Vesa (Autor), Paulasto-Kröckel, Mervi (Autor), Turunen, Markus (Autor), Mattila, Toni T. (Autor), Kivilahti, Jorma (Autor)
Formato: Livre numérique
Lenguaje:Anglais
Publicado: London : Springer London [20..].
Cham : Springer Nature
Edición:2012.
Colección:Microsystems
Acceso en línea:Accès sur la plateforme de l'éditeur
Accès sur la plateforme Istex
Accès Université d'Orléans
Accès INSA CVL
Nota: Archives Springer e-books (Licence nationale)
Archives Springer e-books (Licence nationale)
Autres localisations: Voir dans le Sudoc
Edition sous un autre format:• Interfacial Compatibility in Microelectronics, Texte imprimé, 9781447124696
• Interfacial Compatibility in Microelectronics, Texte imprimé, 9781447124719
• Interfacial Compatibility in Microelectronics, Texte imprimé, 9781447160687
Tabla de Contenidos:
  • Introduction: Away from trial and error methods Materials and interfaces in Microsystems Introduction to mechanics of materials Introduction to thermodynamic-kinetic method Interfacial adhesion in polymer systems Evolution of different types of interfacial structures