Interfacial Compatibility in Microelectronics : Moving Away from the Trial and Error Approach

Interfaces between dissimilar materials are met everywhere in microelectronics and microsystems. In order to ensure faultless operation of these highly sophisticated structures, it is mandatory to have fundamental understanding of materials and their interactions in the system. In this difficult tas...

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Bibliographic Details
Main Authors: Laurila, Tomi, Vuorinen, Vesa (Author), Paulasto-Kröckel, Mervi (Author), Turunen, Markus (Author), Mattila, Toni T. (Author), Kivilahti, Jorma (Author)
Format: Livre numérique
Language:Anglais
Published: London : Springer London [20..].
Cham : Springer Nature
Edition:2012.
Series:Microsystems
Online Access:Accès sur la plateforme de l'éditeur
Accès sur la plateforme Istex
Accès Université d'Orléans
Accès INSA CVL
Note: Archives Springer e-books (Licence nationale)
Archives Springer e-books (Licence nationale)
Autres localisations: Voir dans le Sudoc
Edition sous un autre format:• Interfacial Compatibility in Microelectronics, Texte imprimé, 9781447124696
• Interfacial Compatibility in Microelectronics, Texte imprimé, 9781447124719
• Interfacial Compatibility in Microelectronics, Texte imprimé, 9781447160687

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