Predictive Technology Model for Robust Nanoelectronic Design

Predictive Technology Model for Robust Nanoelectronic Design explains many of the technical mysteries behind the Predictive Technology Model (PTM) that has been adopted worldwide in explorative design research. Through physical derivation and technology extrapolation, PTM is the de-factor device mod...

詳細記述

保存先:
書誌詳細
第一著者: Cao, Yu
フォーマット: Livre numérique
言語:Anglais
出版事項: New York, NY : Springer US 2011.
Cham : Springer Nature
シリーズ:Integrated Circuits and Systems
オンライン・アクセス:Accès sur la plateforme de l'éditeur
Accès sur la plateforme Istex
Accès Université d'Orléans
Accès INSA CVL
注記: Archives Springer e-books (Licence nationale)
Archives Springer e-books (Licence nationale)
Autres localisations: Voir dans le Sudoc
Edition sous un autre format:• Predictive Technology Model for Robust Nanoelectronic Design, Texte imprimé, 9781461404446
• Predictive Technology Model for Robust Nanoelectronic Design, Texte imprimé, 9781461404460
• Predictive Technology Model for Robust Nanoelectronic Design, Texte imprimé, 9781461430216
目次:
  • 1. Introduction
  • 2. Predictive Technology Model of Conventional CMOS Devices
  • 3. Predictive Technology Model of Enhanced CMOS Devices
  • 4. Statistical Extraction and Modeling of CMOS Variability
  • 5. Modeling of Temporal Reliability Degradation
  • 6. Modeling of Interconnect Parasitics
  • 7. Design Benchmark with Predictive Technology Model
  • 8. Predictive Process Design Kits
  • 9. Predictive Modeling of Carbon Nanotube Devices
  • 10. Predictive Technology Model for Future Nanoelectronic Design.