Applied RHEED : reflection high-energy electron diffraction during crystal growth
The book describes RHEED (reflection high-energy electron diffraction) used as a tool for crystal growth. New methods using RHEED to characterize surfaces and interfaces during crystal growth by MBE (molecular beam epitaxy) are presented. Special emphasis is put on RHEED intensity oscillations, segr...
Guardat en:
| Autor principal: | |
|---|---|
| Format: | Livre numérique |
| Idioma: | Anglais |
| Publicat: |
Berlin [etc.] :
Springer
[20..].
Cham : Springer Nature |
| Col·lecció: | Springer tracts in modern physics
154 |
| Matèries: | |
| Accés en línia: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Nota: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Applied RHEED, reflection high-energy electron diffraction during crystal growth, Wolfgang Braun, 1999, Berlin, Springer, 1 vol. (IX-216 p., [2] p. de pl), Springer tracts in modern physics, 3-540-65199-3 • Applied RHEED, Texte imprimé, 9783662156131 • Applied RHEED, Texte imprimé, 9783662156148 |
Taula de continguts:
- MBE-grown semiconductor interfaces
- Reflection high-energy electron diffraction (RHEED)
- RHEED oscillations
- Semikinematical simulations of RHEED patterns
- Kikuchi lines
- RHEED with rotating substrates
- Reconstruction-induced phase shifts of RHEED oscillations
- Energy loss spectroscopy during growth
- Phase shifts: Models
- Applications of reconstruction-induced phase shifts
- Closing remarks.