High resolution x-ray scattering from thin films and multilayers
This critical overview presents experimental methods for solving most frequent strucutral problems of mono-crystalline thin films and layered systems: thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dy...
Enregistré dans:
| Auteurs principaux: | , , |
|---|---|
| Format: | Livre numérique |
| Sprog: | Anglais |
| Udgivet: |
Berlin [etc.] :
Springer
[20..].
Cham : Springer Nature |
| Serier: | Springer tracts in modern physics
149 |
| Fag: | |
| Online adgang: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Kommentar: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • High resolution x-ray scattering from thin films and multilayers, Vaclav Holy, Ullrich Pietsch, Tilo Baumbach, 1999, Berlin, Springer, 1 vol. (XI-256 p.), Springer tracts in modern physics, 3-540-62029-X • High-Resolution X-Ray Scattering from Thin Films and Multilayers, Texte imprimé, 9783662147429 • High-Resolution X-Ray Scattering from Thin Films and Multilayers, Texte imprimé, 9783662147436 |
Indholdsfortegnelse:
- Basic elements of the equipment
- Diffractometers and reflectometers
- Scans and resolution in angular and reciprocal space
- Basic principles
- Kinematical scattering theory
- Dynamical scattering theory
- Layer thicknesses of single layers and multilayers
- Lattice parameters and lattice strains in single expitaxial layers
- Volume defects in layers
- X-ray reflection by rough multilayers
- X-ray scattering by gratings and dots
- A. Wave vectors and amplitudes of the internal wavefields in a dynamically scattering crystal.