High resolution x-ray scattering from thin films and multilayers
This critical overview presents experimental methods for solving most frequent strucutral problems of mono-crystalline thin films and layered systems: thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dy...
Guardat en:
| Autors principals: | , , |
|---|---|
| Format: | Livre numérique |
| Idioma: | Anglais |
| Publicat: |
Berlin [etc.] :
Springer
[20..].
Cham : Springer Nature |
| Col·lecció: | Springer tracts in modern physics
149 |
| Matèries: | |
| Accés en línia: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Nota: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • High resolution x-ray scattering from thin films and multilayers, Vaclav Holy, Ullrich Pietsch, Tilo Baumbach, 1999, Berlin, Springer, 1 vol. (XI-256 p.), Springer tracts in modern physics, 3-540-62029-X • High-Resolution X-Ray Scattering from Thin Films and Multilayers, Texte imprimé, 9783662147429 • High-Resolution X-Ray Scattering from Thin Films and Multilayers, Texte imprimé, 9783662147436 |