High resolution x-ray scattering from thin films and multilayers
This critical overview presents experimental methods for solving most frequent strucutral problems of mono-crystalline thin films and layered systems: thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dy...
Wedi'i Gadw mewn:
| Prif Awduron: | , , |
|---|---|
| Fformat: | Livre numérique |
| Iaith: | Anglais |
| Cyhoeddwyd: |
Berlin [etc.] :
Springer
[20..].
Cham : Springer Nature |
| Cyfres: | Springer tracts in modern physics
149 |
| Pynciau: | |
| Mynediad Ar-lein: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Nodyn: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • High resolution x-ray scattering from thin films and multilayers, Vaclav Holy, Ullrich Pietsch, Tilo Baumbach, 1999, Berlin, Springer, 1 vol. (XI-256 p.), Springer tracts in modern physics, 3-540-62029-X • High-Resolution X-Ray Scattering from Thin Films and Multilayers, Texte imprimé, 9783662147429 • High-Resolution X-Ray Scattering from Thin Films and Multilayers, Texte imprimé, 9783662147436 |
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|---|---|---|---|
| 001 | 970713 | ||
| 008 | 110927q2000 xxe ||| |||| 00| 0 eng d | ||
| 009 | PPN155195220 | ||
| 020 | |a 9783540496250 (PDF) | ||
| 041 | 0 | |a eng | |
| 082 | |a 530 | ||
| 100 | 1 | |a Holý, Václav. | |
| 245 | 1 | 0 | |a High resolution x-ray scattering from thin films and multilayers |c Václav Holý, Ullrich Pietsch, Tilo Baumbach. |
| 260 | |a Berlin [etc.] : |b Springer. | ||
| 260 | |a Cham : |b Springer Nature, |c [20..]. | ||
| 490 | 0 | |a Springer tracts in modern physics |v 149 |x 1615-0430 | |
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 500 | |a Archives Springer e-books (Licence nationale) | ||
| 505 | 0 | |a Basic elements of the equipment -- Diffractometers and reflectometers -- Scans and resolution in angular and reciprocal space -- Basic principles -- Kinematical scattering theory -- Dynamical scattering theory -- Layer thicknesses of single layers and multilayers -- Lattice parameters and lattice strains in single expitaxial layers -- Volume defects in layers -- X-ray reflection by rough multilayers -- X-ray scattering by gratings and dots -- A. Wave vectors and amplitudes of the internal wavefields in a dynamically scattering crystal. | |
| 506 | |a Accès en ligne pour les établissements français bénéficiaires des licences nationales | ||
| 506 | |a Accès soumis à abonnement pour tout autre établissement | ||
| 506 | |a Conditions particulières de réutilisation pour les bénéficiaires des licences nationales. https://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 | ||
| 520 | |a This critical overview presents experimental methods for solving most frequent strucutral problems of mono-crystalline thin films and layered systems: thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dynamical scattering theories describes the experimental methods. This book is a ready-to-hand reference for experimentalists who want to improve their knowledge on modern x-ray methods for thin-film analysis. | ||
| 650 | |a Rayons x |x diffraction | ||
| 650 | |a Cristallographie | ||
| 650 | |a Couches minces | ||
| 650 | |a Rayons X |x Diffusion | ||
| 650 | |a Propriétés optiques | ||
| 650 | |a Surfaces (technologie) | ||
| 650 | |a Couches de Langmuir-Blodgett | ||
| 650 | |a Physique | ||
| 700 | 1 | |a Pietsch, Ulrich. |4 aut | |
| 700 | 1 | |a Baumbach, Tilo, |d 1961- |4 aut | |
| 776 | 0 | |0 04601330X |t High resolution x-ray scattering from thin films and multilayers |f Vaclav Holy, Ullrich Pietsch, Tilo Baumbach |d 1999 |c Berlin |n Springer |p 1 vol. (XI-256 p.) |s Springer tracts in modern physics |z 3-540-62029-X | |
| 776 | 0 | |t High-Resolution X-Ray Scattering from Thin Films and Multilayers |b Texte imprimé |z 9783662147429 | |
| 776 | 0 | |t High-Resolution X-Ray Scattering from Thin Films and Multilayers |b Texte imprimé |z 9783662147436 | |
| 856 | 4 | |q PDF |u https://doi.org/10.1007/BFb0109385 |z Accès sur la plateforme de l'éditeur | |
| 856 | 4 | |u https://revue-sommaire.istex.fr/ark:/67375/8Q1-MNQLK2FZ-M |z Accès sur la plateforme Istex | |
| 856 | 4 | |5 452349901:750660341 |u https://ezproxy.univ-orleans.fr/login?url=https://doi.org/10.1007/BFb0109385 |z Accès Université d'Orléans | |
| 856 | 4 | |5 180339901:754009955 |u https://ezproxy.insa-cvl.fr/login?qurl=https://doi.org/10.1007/BFb0109385 |z Accès INSA CVL | |
| 997 | |0 970713 |1 Livre numérique |a Ressource numérique |b INSA |b ENSA |c 0/Bibliothèque numérique/ |c 1/Bibliothèque numérique/Autre ressource numérique/ | ||