Anomalous X-ray scattering for materials characterization : atomic-scale structure determination
The evolution of our understanding of most properties of new functional materials is related to our knowledge of their atomic-scale structure. To further this, several X-ray and neutron techniques are employed. The anomalous X-ray scattering (AXS) method, exploiting the so-called anomalous dispersio...
Gorde:
| Egile nagusia: | |
|---|---|
| Formatua: | Livre numérique |
| Hizkuntza: | Anglais |
| Argitaratua: |
Berlin [etc.] :
Springer
[20..].
Cham : Springer Nature |
| Saila: | Springer tracts in modern physics
179 |
| Gaiak: | |
| Sarrera elektronikoa: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Oharra: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Anomalous X-ray scattering for materials characterization, atomic-scale structure determination, Yoshio Waseda, Berlin, Springer, 2002, 1 vol. (XIII)-(214 p.), Springer tracts in modern physics, 3-540-43443-7 • Anomalous X-Ray Scattering for Materials Characterization, Texte imprimé, 9783662146361 • Anomalous X-Ray Scattering for Materials Characterization, Texte imprimé, 9783662146378 |
Aurkibidea:
- Structural Characterization of Crystalline and Non-crystalline Materials A Brief Background of Current Requirements
- Experimental Determination of Partial and Environmental Structure Functions in Non-crystalline Systems Fundamental Aspects
- Nature of Anomalous X-ray Scattering and Its Application to the Structural Analysis of Crystalline and Non-crystalline Systems
- Experimental Determination of the Anomalous Dispersion Factors of X-rays Theoretical and Experimental Issues
- In-House Equipment and Synchrotron Radiation Facilities for Anomalous X-ray Scattering
- Selected Examples of Structural Determination for Crystalline Materials Using the AXS Method
- Selected Examples of Structural Determination for Non-crystalline Materials Using the AXS Method
- Anomalous Small-Angle X-ray Scattering
- Anomalous Grazing-Incidence X-ray Reflection
- Merits of Anomalous X-ray Scattering and Its Future Prospects.