Anomalous X-ray scattering for materials characterization : atomic-scale structure determination
The evolution of our understanding of most properties of new functional materials is related to our knowledge of their atomic-scale structure. To further this, several X-ray and neutron techniques are employed. The anomalous X-ray scattering (AXS) method, exploiting the so-called anomalous dispersio...
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| Format: | Livre numérique |
| Jezik: | Anglais |
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Berlin [etc.] :
Springer
[20..].
Cham : Springer Nature |
| Serija: | Springer tracts in modern physics
179 |
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| Online dostop: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
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Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Anomalous X-ray scattering for materials characterization, atomic-scale structure determination, Yoshio Waseda, Berlin, Springer, 2002, 1 vol. (XIII)-(214 p.), Springer tracts in modern physics, 3-540-43443-7 • Anomalous X-Ray Scattering for Materials Characterization, Texte imprimé, 9783662146361 • Anomalous X-Ray Scattering for Materials Characterization, Texte imprimé, 9783662146378 |