Infrared ellipsometry on semiconductor layer structures : phonons, plasmons, and polaritons
The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It desc...
Gardado en:
| Autor Principal: | |
|---|---|
| Formato: | Livre numérique |
| Idioma: | Anglais |
| Publicado: |
Berlin, Heidelberg :
Springer Berlin Heidelberg
[20..].
Cham : Springer Nature |
| Series: | Springer tracts in modern physics
209 |
| Sujets: | |
| Acceso en liña: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Nota: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Infrared Ellipsometry on Semiconductor Layer Structures, Texte imprimé, 9783642062285 • Infrared Ellipsometry on Semiconductor Layer Structures, Texte imprimé, 9783540804291 • Infrared ellipsometry on semiconductor layer structures, phonons, plasmons, and polaritons, Mathias Schubert, Berlin, Springer, 2004, 1 vol. (XI-193 p.), Springer tracts in modern physics, 3-540-23249-4 |
Table des matières:
- Introduction
- Ellipsometry
- Infrared Model Dielectric Functions
- Polaritons in Semiconductor Layer Structures
- Anisotropic Substrates
- Zinsblende-Structure Materials (III-V)
- Wurtzite-Structure Materials (Group-III Nitrides, ZnO)
- Magneto-optic Ellipsometry.