Infrared ellipsometry on semiconductor layer structures : phonons, plasmons, and polaritons
The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It desc...
Guardat en:
| Autor principal: | |
|---|---|
| Format: | Livre numérique |
| Idioma: | Anglais |
| Publicat: |
Berlin, Heidelberg :
Springer Berlin Heidelberg
[20..].
Cham : Springer Nature |
| Col·lecció: | Springer tracts in modern physics
209 |
| Matèries: | |
| Accés en línia: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Nota: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Infrared Ellipsometry on Semiconductor Layer Structures, Texte imprimé, 9783642062285 • Infrared Ellipsometry on Semiconductor Layer Structures, Texte imprimé, 9783540804291 • Infrared ellipsometry on semiconductor layer structures, phonons, plasmons, and polaritons, Mathias Schubert, Berlin, Springer, 2004, 1 vol. (XI-193 p.), Springer tracts in modern physics, 3-540-23249-4 |
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| 100 | 1 | |a Schubert, Mathias. | |
| 245 | 1 | 0 | |a Infrared ellipsometry on semiconductor layer structures : |b phonons, plasmons, and polaritons |c Mathias Schubert. |
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| 260 | |a Cham : |b Springer Nature, |c [20..]. | ||
| 490 | 0 | |a Springer tracts in modern physics |v 209 |x 1615-0430 | |
| 500 | |a Archives Springer e-books (Licence nationale) | ||
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| 505 | 0 | |a Introduction -- Ellipsometry -- Infrared Model Dielectric Functions -- Polaritons in Semiconductor Layer Structures -- Anisotropic Substrates -- Zinsblende-Structure Materials (III-V) -- Wurtzite-Structure Materials (Group-III Nitrides, ZnO) -- Magneto-optic Ellipsometry. | |
| 506 | |a Accès en ligne pour les établissements français bénéficiaires des licences nationales | ||
| 506 | |a Accès soumis à abonnement pour tout autre établissement | ||
| 506 | |a Conditions particulières de réutilisation pour les bénéficiaires des licences nationales. https://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 | ||
| 520 | |a The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. Special emphasis is given to free-charge-carrier properties, and magneto-optical effects. A broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and future applications such as organic layer structures and highly correlated electron systems are proposed | ||
| 650 | |a Chimie | ||
| 650 | |a Surfaces (technologie) | ||
| 650 | |a Ellipsométrie | ||
| 650 | |a Composés semiconducteurs | ||
| 776 | 0 | |t Infrared Ellipsometry on Semiconductor Layer Structures |b Texte imprimé |z 9783642062285 | |
| 776 | 0 | |t Infrared Ellipsometry on Semiconductor Layer Structures |b Texte imprimé |z 9783540804291 | |
| 776 | 0 | |0 092167225 |t Infrared ellipsometry on semiconductor layer structures |o phonons, plasmons, and polaritons |f Mathias Schubert |c Berlin |n Springer |d 2004 |p 1 vol. (XI-193 p.) |s Springer tracts in modern physics |z 3-540-23249-4 | |
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