Fabrication and characterization in the micro-nano range : new trends for two and three dimensional structures
This book shows an update in the field of micro/nano fabrications techniques of two and three dimensional structures as well as ultimate three dimensional characterization methods from the atom range to the micro scale. Several examples are presented showing their direct application in different tec...
محفوظ في:
| مؤلفون آخرون: | , |
|---|---|
| التنسيق: | Livre numérique |
| اللغة: | Anglais |
| منشور في: |
Berlin, Heidelberg :
Springer Berlin Heidelberg
[20..].
Cham : Springer Nature |
| الطبعة: | 1st ed. 2011. |
| سلاسل: | Advanced Structured Materials
10 |
| الوصول للمادة أونلاين: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| ملاحظة: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Fabrication and Characterization in the Micro-Nano Range, Texte imprimé, 9783642177811 • Fabrication and Characterization in the Micro-Nano Range, Texte imprimé, 9783642267543 • Fabrication and Characterization in the Micro-Nano Range, Texte imprimé, 9783642177811 • Fabrication and Characterization in the Micro-Nano Range, Texte imprimé, 9783642177835 • Fabrication and Characterization in the Micro-Nano Range, Texte imprimé, 9783642267543 • Fabrication and Characterization in the Micro-Nano Range, Texte imprimé, 9783642177811 • Fabrication and Characterization in the Micro-Nano Range, Texte imprimé, 9783642177835 |
جدول المحتويات:
- Preface Exploring the possibilities of Laser Interference Patterning for the rapid fabrication of periodic arrays on macroscopic areas Laser Micromachining Patterning and optical properties of materials at the nanoscale Ion beam sputtering, a route for fabrication of highly ordered nanopatterns Three-dimensional Open Cell Structures:Evaluation and Fabrication by Additive Manufacturing X-ray Microtomography: characterisation of structures and defect analysis Submicron Tomography using high energy synchrotron radiation Nano characterization of structures by Focused Ion Beam (FIB) Tomography Atom probe tomography: 3D imaging at the atomic level