X-Ray diffraction crystallography : introduction, examples and solved problems
X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of...
שמור ב:
| Auteurs principaux: | , , |
|---|---|
| פורמט: | Livre numérique |
| שפה: | Anglais |
| יצא לאור: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Springer e-books
[20..].
Cham : Springer Nature |
| גישה מקוונת: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| הערה: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • X-Ray diffraction crystallography, introduction, examples and solved problems, Yoshio Waseda, Eiichiro Matsubara, Kozo Shinoda, Berlin, Springer, 2011, 1 vol. (XI-310 p.), 978-3-642-16634-1 |
תוכן הענינים:
- Fundamental Properties of X-rays Geometry of Crystals Scattering and Diffraction by Atoms and Crystals Diffraction from a Polycrystalline Sample and its Application to Determination of Crystal Structures Reciprocal Lattice and Integrated Intensity from Crystals Symmetry Analysis for Crystals and the Use of International Tables Solved Problems