Reliability of Nanoscale Circuits and Systems : Methodologies and Circuit Architectures
Reliability of Nanoscale Circuits and Systems: Methodologies and Circuit Architectures Milos Stanisavljevic Alexandre Schmid Yusuf Leblebici Future integrated circuits are expected to be made of emerging nanodevices and their associated interconnects, but the reliability of such components is a majo...
Gardado en:
| Auteurs principaux: | , , |
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| Formato: | Livre numérique |
| Idioma: | Anglais |
| Publicado: |
New York, NY :
Springer New York
2011.
Cham : Springer Nature |
| Acceso en liña: | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex Accès Université d'Orléans Accès INSA CVL |
| Nota: |
Archives Springer e-books (Licence nationale) Archives Springer e-books (Licence nationale) |
| Autres localisations: | Voir dans le Sudoc |
| Edition sous un autre format: | • Reliability of nanoscale circuits and systems, methodologies and cicuits architecture, Milos Stanisavljevic, Alexandre Schmid, Yusuf Leblebici, New York, NY, Springer, 2011, 1 vol. (XXVII-195 p.), Electrical Engineering, 978-1-4419-6216-4 • Reliability of Nanoscale Circuits and Systems, Texte imprimé, 9781441962188 • Reliability of Nanoscale Circuits and Systems, Texte imprimé, 9781489982544 |
Table des matières:
- Introduction
- Reliability, Faults and Fault Models
- Nanotechnology and Nanodevices
- Fault-Tolerant Architectures and Approaches
- Reliability Evaluation Techniques
- Averaging Design Implementations
- Statistical Evaluation of Fault-Tolerance Using Proability Density Functions
- System Level Reliability Evaluation and Optimization
- Summary and Conclusions
- References.