Singh, N. An Artificial Intelligence Approach to Test Generation. Springer International Publishing.
Style de citation Chicago (17e éd.)Singh, Narinder. An Artificial Intelligence Approach to Test Generation. Cham: Springer International Publishing.
Style de citation MLA (8e éd.)Singh, Narinder. An Artificial Intelligence Approach to Test Generation. Springer International Publishing.
警告：這些引文格式不一定是100％准確.