Singh, N. An Artificial Intelligence Approach to Test Generation. Springer International Publishing.
Chicago-referens (17:e uppl.)Singh, Narinder. An Artificial Intelligence Approach to Test Generation. Cham: Springer International Publishing.
MLA-referens (8:e uppl.)Singh, Narinder. An Artificial Intelligence Approach to Test Generation. Springer International Publishing.
Varning: dessa hänvisningar är inte alltid fullständigt riktiga.