Singh, N. An Artificial Intelligence Approach to Test Generation. Springer International Publishing.
Chicago (17e ed.) BronvermeldingSingh, Narinder. An Artificial Intelligence Approach to Test Generation. Cham: Springer International Publishing.
MLA (8e ed.) BronvermeldingSingh, Narinder. An Artificial Intelligence Approach to Test Generation. Springer International Publishing.
Let op: Deze citaties zijn niet altijd 100% accuraat.