Singh, N. An Artificial Intelligence Approach to Test Generation. Springer International Publishing.
Chicagoスタイル(17版)引用形式Singh, Narinder. An Artificial Intelligence Approach to Test Generation. Cham: Springer International Publishing.
MLA(8版)引用形式Singh, Narinder. An Artificial Intelligence Approach to Test Generation. Springer International Publishing.
警告: この引用は必ずしも正確ではありません.