Singh, N. An Artificial Intelligence Approach to Test Generation. Springer International Publishing.
शिकागो शैली (17वां संस्करण) प्रशस्ति पत्रSingh, Narinder. An Artificial Intelligence Approach to Test Generation. Cham: Springer International Publishing.
एमएलए (8वां संस्करण) प्रशस्ति पत्रSingh, Narinder. An Artificial Intelligence Approach to Test Generation. Springer International Publishing.
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